The start of the nanotechnology era was to a large extent shaped by the advancement of measurement and charactersation techniques. Nearly 30 years on, milestones in nanotechnology are still going hand-in-hand with breakthroughs in characterisation technologies, and restrictions to the application of nanotechnology are set by limits of measurement and detection methods.

Measurement and characterisation play a central role in the development and advancement of nanotechnologies, from enabling state-of-the-art R&D, to ensuring occupational and environmental safety, to supporting quality assurance and standards certification.

This NIA Masterclass & Workshop is organised and run in collaboration with CEMMNT, the Centre of Excellence in Metrology for Micro and Nano Technologies. It will give an overview of the role of measurement and characterisation in applied nanotechnologies, and subsequently highlight the added commercial value provided by advanced measurement and characterisation technologies, using a number of case studies delivered by both technology provides and users.

Follow this link to download the Event Agenda & Programme.

To find out more, or to book a place, please contact the NIA at enquiries@nanotechia.co.uk.